Envision Product Design x ray inspection

 


In the United States, in January 2000, Envision announced the first in a series of digital x ray inspection equipment based on CMOS sensors. The underlying technology for these x-ray image system products was developed and patented by NASA’s Jet Propulsion Lab in 1995. Today our digital x ray inspection technology ranges from the world’s smallest wearable x-ray flat panel portable system, to sophisticated high-energy computed tomography digital x ray inspection systems. Our quality radiology capabilities have proven that we are not equal to our competitors; we are leading the radiography and imaging industry. Visit our website at www.cmosxray.com or call 907-563-1141 for more information on our products and services.

 

 

 

 

 

 

 

 

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