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EnvisionScan™ |
TIS 6/2004 |
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Tire Inspection System (TIS 2.0) |
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Using the latest CMOS X-ray imaging technology, the TIS can complete a 54-inch wide, high-resolution digital X-ray scan, 360 degrees around a tire in approximately 10 seconds. The system is sturdy, compact and easily deployed into new or existing facility production lines. The TIS system is easily retrofitted into existing Luminex systems. High-resolution X-ray images are presented in real-time scrolling on the computer display as the tire rotates. Images can be paused and printed on demand or conveniently archived for later recovery. |
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Specifications |
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Detector: |
CMOS SegmentedArray™ with 54” active length in five seamless segments |
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Compatability: |
Retrofits Luminex tire inspection systems for increased image quality and service life |
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Image resolution: |
80 microns (.003") @ 1 pixel binning, tire inspection is typically performed at 13 pixel binning providing high-speed inspection at 300-400 micron resolution at the tire surface |
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Sensitivity: |
2-2T |
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X-ray requirements: |
240 degree constant potential tube |
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Scan speed: |
120 inches in 10 seconds |
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Image file size: |
150KB/sq.in at 1 pixel binning, full tire image at 13 pixel binning equals ≈ 4 MB |
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Workstation: |
>2 GHz industrial PC, 1GB RAM, 100 GB hard drive, CD-RW, DVD-R, 1.44 MB floppy, 24” Sony high-resolution display |
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Software: |
Powerful software package including x-ray image acquisition/ enhancement/ measurement, scan manipulation, and image storage/ export/print |
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Power: |
110-220 volts, 50-60 Hz, 120 watts total for workstation and scanner |
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Enclosure: |
Powder coated Aluminum with carbon fiber collimation window |
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Specifications subject to change without notice |
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Envision Product Design 7800 King St. Anchorage, Alaska 99518 907-563-1141 Fax 907-563-1142 |
